Nikon Metrology says its Mk 4 XT V platform iteration offers improvements to improve the user’s experience and system reliability changes to increase up time. The company says the XT V real-time X-ray allows users to navigate complex printed circuit boards and electronic components to trace defects on electronic components and assemblies.

The system provides real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applications, claims Nikon. An isolated monitor arm and console has been added, which allows for independent adjustment. There is also improved safety and reliability with compliance to the latest European standards.